- Scientists and researchers working on thin film analysis
- Aeris XRD users wanting to expand their instrument’s capabilities
- Learn about: The evolution of the Aeris compact XRD platform and its new X-ray Reflectometry (XRR) capability, plus how XRD remains accessible, reliable, and easy to use.
- Discover how: Aeris simplifies XRR workflows, making advanced thin-film and surface analysis, like measuring thickness, density, and roughness, as straightforward as routine powder XRD.
- Understand why: XRR expands analytical possibilities for coatings, multilayers, and advanced materials, enhancing Aeris as a powerful, everyday platform for deeper material insight.
Aeris: High Quality Data and Now Reflectometry Ready
July 7, 2026 | 15:00 - 15:45 CET | Virtual
About The Event
Discover the next evolution of Aeris compact XRD with the launch of new X-ray Reflectometry (XRR) capability. In this webinar, we will explore how Aeris continues to make X-ray diffraction accessible, reliable, and easy to use, and how its latest XRR capability opens new possibilities for thin-film and surface analysis. XRR is widely used to characterize film thickness, density, roughness, and interface quality in coatings, multilayers, and advanced materials. Although often considered a more complex technique, Aeris simplifies the workflow, making reflectometry as approachable as routine powder XRD. Join us to learn why Aeris is already a powerful platform for everyday XRD, what XRR can reveal about your materials, and how Aeris makes advanced thin-film analysis easier than ever.
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