- Scientists and researchers interested in developing new, rare-earth-based double perovskites and their derivatives.
- Scientists and researchers interested in piezoelectric materials.
- Anyone interested in or working on X-ray diffraction, X-ray photoelectron spectroscopy & luminescence, MEMS, and sensors.
- Learn what grave impact crystallographical features have on basic luminescent properties of freshly developed materials.
- Discover how to synthesize new, rare-earth-based double perovskites.
- Understand why XRD & XPS are so important in the initial assessment of newly discovered structures in prospect of their future applications.
- Strong impact of AlN as a seed layer on the graining, crystalline quality, and piezoelectric properties of thin films.
- Explore the potential of sputter deposited AlN thin films with higher yttrium concentration for use in silicon MEMS applications, potentially replacing traditional materials.
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Advances in Material Science: Exploring Novel Perovskite and Thin Film Technologies
April 25, 2024 | 16:30 - 17:30 CET | Virtual
About The Event
Structural assessment of novel A2REWO6 double perovskites (A = Ba/Sr/Ca, RE = Ce, Pr) for future photovoltaic purposes: In this first presentation, Damian paper’s will be focused on the research of two barium tungstate double perovskites hosting Ce and Pr. He will discuss derivative structures obtained from calcium- and strontium-carrying hosts, alongside their stability and temperature expansion coefficients determined through XRD and high-temperature measurements. XPS spectra will be used to estimate the average probability of finding differently charged occupation sites, crucial for understanding photoluminescent effects under NUV light. Don't miss this insightful discussion on the efficiency and implementation prospects of these compounds. Impact of AlN Seed Layer on Microstructure and Piezoelectric Properties of YxAl1−xN (x = 15%) Thin Films: In the second presentation, Shardul paper’s will explore the impact of an AlN seed layer on the growth and piezoelectric properties of Y0.15Al0.85N thin films, reporting a significant increase in piezoelectric performance. It will also discuss the exceptional oxygen resistance of the Y0.15Al0.85N layers, even at high temperatures in a pure oxygen environment. Various analytical techniques such as X-ray diffraction, atomic force microscopy, nano-indentation, and high-resolution transmission electron microscopy were employed to support the findings and correlate them with piezoelectric coefficient measurements.
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Who should attend?
What will you learn?
Structural assessment of novel A2REWO6 double perovskites (A = Ba/Sr/Ca, RE = Ce, Pr) for future photovoltaic purposes:
Impact of AlN Seed Layer on Microstructure and Piezoelectric Properties of YxAl1−xN (x = 15%) Thin Films:
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