Unveiling AMASS 2.0: Elevate Your X-ray diffraction analysis

About The Event

Join us as we introduce AMASS 2.0, the advanced version of our software for analysing X-ray diffraction and X-ray reflectivity from thin films. In this session, our expert will unveil the latest capabilities and enhancements packed into AMASS 2.0: - Free-Form Analysis Method: Explore our new, powerful tool designed for in-depth analysis of X-ray reflectivity (XRR) data. The free-form analysis is a model-independent algorithm tailored for complex thin films with layer interactions, interdiffusion, oxidation, and more. - Combined Fit of Different Measurements: Learn about the enhanced capabilities of AMASS 2.0 with the ability to perform a combined fit of data measured in different ways. This includes scenarios like XRR + XRD, XRD for two different reflections, or even two different wavelengths. - Advanced Parameter Linking - Find out how the advanced parameter linking may help you to better control the fitting process of XRR or XRD. - Extended Peak Search Functionality: Delve into the expanded capabilities of the peak search - the window-based algorithms are now complemented with derivatives-based peak search. - Enhanced COM-Interface Functions: Understand the added functions to the Component Object Model (COM). An interface extending capabilities of AMASS with scripting languages to automate your own complex workflows. - Interface Refreshment: Experience a smoother user interface with overall enhancements. Don't miss this opportunity to elevate your X-ray scattering analysis with AMASS 2.0. Register now to secure your spot and stay ahead in the realm of advanced materials analysis!