We cordially invite you to join us for the upcoming Malvern Panalytical Future Days. This event will provide you with an opportunity to engage with distinguished industrial guest speakers and gain valuable insights into the latest advancements in the silicon and compound semiconductor industry.
Our event will feature informative discussions on cutting-edge solutions, ranging from substrates to devices and metrology, that are supporting these dynamic markets. Seats are limited, so we encourage you to reserve your place as soon as possible to ensure that you don't miss this opportunity to stay ahead of the curve.
We look forward to welcoming you to this exciting event and the chance to share our collective knowledge and experience.
Chief Quality Officer
Okmetic Oy - Vantaa, Finland
Strategic Marketing Director
Application Specialist XRF
Segment Manager - Semiconductor
Professional Moderator - Consultant
Sector Director Advanced Materials
14:00-14:15: Introduction and Welcome by Gjalt Kuiperes and Lars Grieger
14:15-14:30: Advanced Silicon Solutions for MEMS, RF and PowerElectronics Applications - by Vesa Lempinen from Okmetic Oy, Finland
14:30-14:40: Round table discussionabout new substrate solutions with Vesa Lempinen
14:40-14:55: Power GaN technology for the mainstream applications - by Dilder Chowdhury, Nexperia B.V., Netherlands
14:55-15:05: Round table discussion about new product trends with Dilder Chowdhury
15:05-15:20: Beyond Toolmatching - How to optimize XRF Wafer Metrology on System- and Fab Level - by Vincent Kip, Malvern Panalytical
15:20-15:30: Round table discussion about new X-Ray metrology trends with Vincent Kip
15:30-15:45: Connected metrology - Characterizing complex layer stacks along the manufacturing chain - by Johannes Zettler, LayTec AG
15:45-15:55: Round table discussion about new combined metrology with Johannes Zettler
15:55-16:05: New XRD Solutions from Lab to Fab - by Lars Grieger, Malvern Panalytical
16:05-17:00: Live round table discussion - All Experts