- 14:00-14:15: Introduction and Welcome by Gjalt Kuiperes and Lars Grieger
- 14:15-14:30: Advanced Silicon Solutions for MEMS, RF and Power Electronics Applications - by Vesa Lempinen from Okmetic Oy, Finland
- 14:30-14:40: Round table discussion about new substrate solutions with Vesa Lempinen
- 14:40-14:55: Power GaN technology for the mainstream applications - by Dilder Chowdhury, Nexperia B.V., Netherlands
- 14:55-15:05: Round table discussion about new product trends with Dilder Chowdhury
- 15:05-15:20: Beyond Toolmatching - How to optimize XRF Wafer Metrology on System- and Fab Level - by Vincent Kip, Malvern Panalytical
- 15:20-15:30: Round table discussion about new X-Ray metrology trends with Vincent Kip
- 15:30-15:45: Connected metrology - Characterizing complex layer stacks along the manufacturing chain - by Johannes Zettler, LayTec AG
- 15:45-15:55: Round table discussion about new combined metrology with Johannes Zettler
- 15:55-16:05: New XRD Solutions from Lab to Fab - by Lars Grieger, Malvern Panalytical
- 16:05-17:00: Live round table discussion - All Experts
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Malvern Panalytical Future Days
Focus on Semiconductor
March 22, 2023 | 14:00 - 17:00 CET | Virtual
About The Event
We cordially invite you to join us for the upcoming Malvern Panalytical Future Days. This event will provide you with an opportunity to engage with distinguished industrial guest speakers and gain valuable insights into the latest advancements in the silicon and compound semiconductor industry. Our event will feature informative discussions on cutting-edge solutions, ranging from substrates to devices and metrology, that are supporting these dynamic markets. Seats are limited, so we encourage you to reserve your place as soon as possible to ensure that you don't miss this opportunity to stay ahead of the curve. We look forward to welcoming you to this exciting event and the chance to share our collective knowledge and experience.