X-Ray Diffraction Course Part-2: Beyond powders - Analysis of bulk, thin films and nanoparticle samples (2)

About The Event

COURSE CONTENT: The 5-day course will be held in the Application Competence Center of Malvern Panalytical (Almelo, The Netherlands), and it will cover the fundamental and practical aspects of Residual Stress, Grazing Incidence X-Ray Diffraction (GI-XRD), X-Ray Reflectivity (XRR) and Small-Angle X-Ray Scattering (SAXS). Emphasis will be on hands-on experience with the Empyrean instrument, in conjunction with Data Collector and the relevant analytical software packages. Participants are encouraged to bring their characteristic scans, or one or two of their relevant samples (together with the corresponding sample submission forms and safety data sheets – ask for this option during the registration process). This course is intended to be a follow-up of the 5-day X-Ray Diffraction Course Part-1: Powder diffraction. KEY BENEFITS: • help you to master the use of your instrument, when performing measurements of Residual Stress on bulk materials, GI-XRD and XRR on thin films, and SAXS on nanomaterials; • get the best results out of your instrument in terms of highest data quality; • effective and reliable data analysis. This is a paid course at the rate of 700 Euro per participant per day. For in-person courses offered at Malvern Panalytical, travel and accommodation expenses are not included. Lunches are provided during in-person course days. Course registration will close 3 weeks prior to the course starting date, or as soon as the class is full. Should you cancel your registration less than 15 working days before the start of the course, a cancellation fee of 25% of the cost price will be charged. We reserve the right to cancel courses due to insufficient enrolment or unforeseen circumstances.