- Ribbon and cake cutting
- Unveiling of the cutting-edge SDCom
- Applications in various semiconductor materials from SiC, Si to synthetic diamonds
- Crystal orientation using the Azimuthal XRD scan method
- Physics behind XRD for better experimental set up
- Applying XRD for phase identification & quantification in powders, solids, thin films and more
- Latest advancements in XRD from in-situ to in-operando analysis and more
- Live demonstration from the lab on the cutting-edge multi-purpose Empyrean XRD
- Non-destructive elemental testing of powders, solids, liquids and multilayer thin film semiconductor materials
- Introduction to the various methods in sample preparation for XRF from pressed pellet to fused bead method
- Fusion sample preparation using the LeNeo
- Elemental XRF analysis on the high throughput and high sensitivity XRF, Zetium
- Sample type and the related sample holder to utilise
- Understanding your level of material fluorescence and knowing which type of detector, optics and X-ray tube to utilise
- Best practices for excellent quality data collection
- Best practises in pressed pellet and fused bead sample preparation
- Dos and don’ts in sample preparation for optimal results
- Book here
- Discuss your challenges
- See the operations of our XRD / XRF
- Anyone who is keen to learn more about different analytical techniques for material characterisation
- Anyone already using XRD and XRF techniques
- How to obtain superior data quality with the optimised experimental set up
- Pick up best practises from sample preparation, experimental design to data analysis
- Learn how to apply the various techniques of XRD and XRF to your analysis of powders, thin films, solids and more
X-raydiate Materials Characterisation Workshop (India, Assam)
7 May, 9.30am - 5.30pm | Guwahati University, Assam
About The Event
In materials characterisation,X-ray diffraction is fundamental towards understanding how a material behaves, whether in terms of temperature or humidity or in stress and strain etc. It is often used by physicists, chemists and many functions to analyse multitude of materials, from semiconductors, electronics, batteries, pharmaceuticals and more. Elemental analysis is of utmost importance to screen for contaminants or to check that elemental composition is at its desired levels whether during incoming raw material screening or process manufacturing. During this edition of X-raydiate, we are proud to partner with Guwahati University to share knowledge about the non-destructive techniques of X-ray diffraction and X-ray fluorescence. Learn about best practices towards data collection, data analysis. Our experts will share how to properly design experiments, the optimal analytical tools for superior data analysis as well as key perimeters for sample preparation. Use this session to get 1-on-1 time to address your challenges as well as see live demos.
More Information
Programme:
Time |
Agenda |
Speaker |
09:30 |
Registration |
|
10:00 |
Welcome address |
|
10:15 |
Inauguration of Malvern Panalytical’s latest technology for ultra-fast crystal orientation |
|
10:30 |
Ultra-fast crystal orientation |
Mr. Jitendra Kumar Regional Specialist for Semiconductor Solutions |
11:00 |
Latest trends & advancements in X-ray diffraction |
Dr. Mangesh Mahajan, Head, Applications Scientist, Malvern Panalytical |
12:15 |
Lunch |
|
13:15 |
|
|
13:45 |
Elemental analysis using X-ray fluorescence |
Mr. Brijendra Srivastava Senior Applications Specialist, Malvern Panalytical |
14:15 |
Break |
|
14:45 |
Live demo from the lab (Elemental analysis) |
|
15:15 |
Sample handling and sample preparation best practises |
|
XRD sample handling |
Dr. Mangesh Mahajan |
|
XRF sample handling and sample preparation |
Mr. Brijendra Srivastava |
|
16:15 |
Questions and answers |
|
16:30 |
Conclusion and certificate distribution / Opportunity for 1-on-1 time with our specialists |
|
17:30 |
End |
Who should attend?
What will you learn?
Don’t miss out - book your place
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